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Atomic Force Microscopy: Advancing Nanoscale Imaging and Material Characterization
Atomic Force Microscopy (AFM) has emerged as one of the most versatile and powerful tools in nanotechnology, enabling researchers to visualize, measure, and manipulate materials at the atomic and molecular scale. Since its introduction in the late 1980s, AFM has played a transformative role across scientific disciplines, ranging from materials science and semiconductor research to biology, chemistry, and surface engineering.
What Is Atomic Force Microscopy?
Atomic Force Microscopy is a type of scanning probe microscopy that uses a sharp probe—often with a tip radius of just a few nanometers—to scan the surface of a sample. As the tip interacts with the sample surface, it detects forces such as van der Waals interactions, electrostatic forces, and mechanical properties. These interactions are translated into high-resolution topographical images, often with sub-nanometer precision.
